QorvoQM18183 Process Node Assessment with TEM Option

This report presents a Process Node Assessment of the Qorvo D1QM01818330 RF antenna tuner die found inside the Qorvo QM18183 package. The QM18183 was extracted from the antenna tuning flex substrate of the Apple iPhone 8 Plus.
This report contains the following detailed information:

• Selected teardown photographs, package photographs, package X-rays, die markings, and die photographs
• SEM cross-sectional micrographs of the general structure of the die dielectric materials, major features, and transistors
• Measurements of vertical and horizontal dimensions of major microstructural features
• Transmission electron microscopy (TEM) cross-sectional micrographs of the transistors and the gate oxide
• TEM-based energy dispersive spectroscopy (TEM-EDS) analysis of the dielectrics, metals, and transistors